Spectro Analytical Instruments Khang Thinh Technical Import Export Company Limited
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The FT110A XRF Coating Thickness Gauge has a new auto focus function which automatically focuses on the sample to acquire optical image within a few seconds. No manual adjustment is required, which results in higher throughput.
Key benefits:
- Easy operation
- Precisely measures 50 nm Au coating thickness in 10 seconds
- Measurement without the standard sample
- Easy positioning using the Wide View System (option)
Contact:
0867.743.986
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Equipped with polycapillary X-ray focusing optics and a silicon drift detector, FT160 enables high preciseness and high throughput in nano-order level coating thickness measurement of electronic parts.
Contact:
0867.743.986
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The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a ground-breaking analyzer that effectively ‘sets up’ itself, making it possible to analyze many more parts within a single shift.
Contact:
0867.743.986
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SPECTROMAXx: Next-Generation Improvements Lead the Way for Ultra-Reliable Metals Analysis Performance
Unique iCAL 2.0 one sample standardization helps maintain the same standardization — regardless of most temperature shifts and saves on average 30 minutes per day
Up to 64% reduced argon consumption during standby, compared to previous models
Extended wavelength range for the ability to analyze hydrogen and oxygen (example: titanium base)
Ideal for routine analysis and precise analysis of all incoming/outgoing materials and for process control (including nitrogen) in foundries — covering 10 matrices, 68 methods and 56 elements
Applications: Metal manufacturing; Metal processing; Analysis of precious metals; Detection and Analysis of Inclusions
Contact:
0867.743.986
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SPECTROCHECK – The highest performance and dependability at the lowest possible price
Ideal for metal testing and quality control of iron-, aluminum- and copper-based samples; as well as dedicated solder bath analysis
Ultra-fast one sample standardization – based on SPECTRO´s Intelligent Calibration Logic (iCAL) – saves on average 30 minutes per day
Industry unique app-like concept for user-friendly software operation
Applications: Metal manufacturing; Metal processing; Analysis of precious metals; Detection and Analysis of Inclusions
Contact:
0867.743.986
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SPECTROPORT – The easy choice when you can´t afford to make metal mistakes
Unlike handheld XRF, accurately analyzes elements like C, P, S, B, Li, Be, Ca, Si, Mg and Al even at low and critical levels, in only a maximum of 10s
Consistent results with unique new iCAL 2.0 one sample standardization combined with self-adjusting optical system – resilient to ambient temperature changes and saves on average 30 minutes per day
Effortless point-and-shoot analysis, battery powered operation – up to 800 measurements on a single charge
Application: Non-destructive testing NDT/PMI; Metal manufacturing; Metal processing; Metal recycling
Contact:
0867.743.986
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The arc/spark mobile metal analyzer for precise analysis without compromise
No compromise: high resolution optical system for probably widest element range (even N, Li, Na), all elements necessary for a complete metal analysis on the spot are available
Unique new iCAL 2.0 one sample standardization helps maintain the same standardization – regardless of most temperature shifts and saves on average 30 minutes per day
Flexible point-and-shoot analysis with various quick to change sample probes, battery powered operation – up to 800 measurements on a single charge
Applications: Metal manufacturing; Metal processing; Metal recycling; NDT/PMI testing; Raw materials checking
Contact:
0867.743.986
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SPECTROLAB S – A True Revolution in High-End Metal Analysis
Highly accurate results in under 20 seconds (example: low-alloy steels)
Regular maintenance intervention requirements (spark stand cleaning) reduced by a factor of 8
On average factor 2 improvement in detection limits for low-alloy steels and a factor 5 improvement for pure aluminum metals versus previous models
Instrument footprint reduced by 27%
iCAL 2.0 — one sample standardization for the complete system, saving 30 minutes a day
Applications: Metal manufacturing; Metal processing; Analysis of precious metals; Detection and Analysis of Inclusions; Automotive; Electronic Goods; Semiconductor
Contact:
0867.743.986
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